ECC- Algorithm

[Hari]

I am currently working in a development of error detection and
correction algorithm. I found a sample ECC algorithm provided by
Samsung for NAND flash.

Please checkup the algorithm following link.

http://www.samsung.com/Products/Semiconductor/Memory/appnote/samsung_new_ecc_for_512byte_256word.txt

The ECC algorithm detects all Single bit errors. It generates 3 ECC
(Parity code) bytes for a given data of 512bytes

We need to generate ECC codes for the original data and corrupted data.
We can generate ECC bytes using the function make_ecc_512(). Later we
need to compare them using the function.compare_ecc_512().

Problem:
It doesn't detects 0000 bits change to 1111 bit. & viceversa. (ie. Data
0x0000 changes to 0xFFFF is detected as NO_ERROR).

Reason:
The ECC generated for 0x0000 and 0xFFFF are the same.

Can anyone help me to resolve the issue.

Thanks in advance.

Regards,
Hari

 

[dcorbit]

I am currently working in a development of error detection and
correction algorithm. I found a sample ECC algorithm provided by
Samsung for NAND flash.

Please checkup the algorithm following link.

http://www.samsung.com/Products/Semiconductor/Memory/appnote/samsung_new_ecc_for_512byte_256word.txt

The ECC algorithm detects all Single bit errors. It generates 3 ECC
(Parity code) bytes for a given data of 512bytes

We need to generate ECC codes for the original data and corrupted data.
We can generate ECC bytes using the function make_ecc_512(). Later we
need to compare them using the function.compare_ecc_512().

Problem:
It doesn't detects 0000 bits change to 1111 bit. & viceversa. (ie. Data
0x0000 changes to 0xFFFF is detected as NO_ERROR).

Reason:
The ECC generated for 0x0000 and 0xFFFF are the same.

Can anyone help me to resolve the issue.

Thanks in advance.

You are way off topic here. Probably, comp.programming would have been

closer to your goal.

Try this:
http://www.eccpage.com/

HTH